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Aplicações do método Warren-Averbach de análise de perfis de difração / Applications of the Warren-Averbach method of X-ray diffraction line profile analysis

Made available in DSpace on 2014-10-09T12:42:15Z (GMT). No. of bitstreams: 0 / Made available in DSpace on 2014-10-09T14:05:30Z (GMT). No. of bitstreams: 0 / Dissertação (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP

Identiferoai:union.ndltd.org:IBICT/oai:10.40.40.102:123456789/10585
Date09 October 2014
CreatorsICHIKAWA, RODRIGO U.
ContributorsOrientador: Luis Gallego Martinez
Source SetsIBICT Brazilian ETDs
Detected LanguagePortuguese
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format94
Sourcereponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
CoverageN
Rightsinfo:eu-repo/semantics/openAccess

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