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Characterization of Zinc Oxide Nanotip Prepared by Aqueous Solution Deposition on Sputtered Zinc Oxide Nucleation Layer

In this study, we prepare the zinc oxide nanotip with aqueous solution deposited on ZnO nucleation layer. The directions of nanotip are formed with different ZnO nucleation layer time. The thermal annealing with N2 ambiance at 300 ¢J for 1 hr increase the UV emission and decrease the defects. We use ZnO nanotip as an anti-reflection layer because of surface roughness and optical interference. ZnO nanotip with rough surface decreases reflection and enhance the transmission, so we use ZnO nanotip as an anti-reflection layer, after growin ZnO nanotip on solar cell the efficiency of solar cell was enhancement.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0729110-164903
Date29 July 2010
CreatorsCheng, Nai-roug
ContributorsI-kai Lo, Chien-Chang Wu, Ming-Kwei Lee, Kuo-Mei Chen, Tsu-Hsin Chang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageEnglish
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0729110-164903
Rightsnot_available, Copyright information available at source archive

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