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Characterization of interfaces by elastic light scattering and profilometry /

Extr. de--Uppsala (Suède)--Université d'Uppsala, 2000. / Bibliogr. p. 73-79.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/469502886
Date January 1999
CreatorsLindström, Tomas.
PublisherUppsala : Acta universitatis upsaliensis,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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