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A BIST (built-in self-test) strategy for mixed-signal integrated circuits

Nürnberg, University, Diss., 2004--Erlangen.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/615090559
CreatorsLi, Hongzhi.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.

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