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Enhancement of direct sample insertion performance for inductively coupled plasma atomic emission spectrometry

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:1n79h627j
Date January 1997
CreatorsSkinner, Cameron D.
ContributorsSalin, Eric (Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationProquest: NQ44588, Pid: 35411

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