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Experimental deterimination of argon atomic transition probabilities using non-LTE diagnostics

No description available.
Identiferoai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/17969
Date12 1900
CreatorsSedghinasab, Ahad
PublisherGeorgia Institute of Technology
Source SetsGeorgia Tech Electronic Thesis and Dissertation Archive
Detected LanguageItalian
TypeDissertation
RightsAccess restricted to authorized Georgia Tech users only.

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