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Measurement of Material Thickness using X-Ray Attenuation

The 60 kev x-rays from Americium-241 (241Am) have been used in an x-ray attenuation experiment to measure the thickness and attenuation coefficient of an aluminum alloy. Using traditional measurement tools such as a micrometer, to determine the thickness and uniformity of soft metal targets and curved aluminum target cell windows is challenging. Furthermore, the determination of window thickness is important to Jefferson Lab experiments, in particular the Qweak experiment. In this thesis, the thickness of Aluminum foil AL7057 is determined with high accuracy using x-ray attenuation. Using the x-ray attenuation technique has the advantage of nondestructive measurement.

Identiferoai:union.ndltd.org:MSSTATE/oai:scholarsjunction.msstate.edu:td-4027
Date11 August 2017
CreatorsAltayar, Abdullah Riyad
PublisherScholars Junction
Source SetsMississippi State University
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceTheses and Dissertations

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