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Secondary abnormal grain growth in barium titanate

Secondary abnormal grain growth (SAGG) during sintering of barium titanate has been explained in terms of twin plane re-entrant edge (TPRE) growth mechanism by {111} double twin lamellae. But during sintering of Ti-excess barium titanate, {111} double twins lamellae are observed with out SAGG. In our group, Lin founded that when combine two different Ba/Ti ratio of powder to sintering above the eutectic temperature, the SAGG is observed in the interface between two different powders. Therefore, this thesis consists of three major researches: (a) {111} double twin, (b) Ba/Ti ratio, (c) liquid phase.
In the experiment, we follow Lin¡¦s experiment to sinter the specimen contain with SAGG. And in this specimen, it can observe the specimen divided into three type of growth grain: (a) top surface with normal grain growth (NGG), (b) intermediate layer with abnormal grain growth (AGG), (c) bottom layer with secondary abnormal grain growth. It can all observed {111} double twin in these three different type of layer. This result confirmed that SAGG are not induced by TPRE growth mechanism. Then we used SEM/EDS to analysis the Ba/Ti ratio in the different type of grain growth layer. The Ba/Ti ratio in this analysis is not differing in NGG, AGG and SAGG. Therefore, we used OM, SEM, TEM to observe the grain boundary and triple grain junction in NGG, AGG and SAGG. It can observe that only the grain boundary and triple grain junction in SAGG are complete wetting. The experimental results shows that the grain growth behavior controlled by the liquid phase wetting degree.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0901109-181231
Date01 September 2009
CreatorsHsieh, Cheng-yan
ContributorsYu-Chuan Wu, Hong-Yang Lu, Wei-Lin Wang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0901109-181231
Rightsrestricted, Copyright information available at source archive

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