Grain boundary diffusion in thin films : a finite element analysis /

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Thesis (Ph. D.)--Lehigh University, 2000. / Includes bibliographical references and vita.

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/46955597
Date	January 2000
Creators	Ho, Ji-Wei,
Source Sets	OCLC
Language	English
Detected Language	English
Type	Academic dissertations