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Built-in self test for regular structure embedded cores in system-on-chip

Thesis(M.S.)--Auburn University, 2005. / Abstract. Vita. Includes bibliographic references (p.91-96).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/243622596
Date January 2005
CreatorsGarimella, Srinivas Murthy, Stroud, Charles E.
PublisherAuburn, Ala. ,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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