The complexity of electronic system is increasing rapidly and many of the electronic systems are embedded systems implemented as system-on-chip (SoC). This increasing complexity of SoC leads to longer test application time (TAT). One approach to reduce the TAT is to perform tests to several cores in parallel, which requests transporting test data in parallel instead of sequentially. In IEEE Std. 1500, it supports parallel test mode by incorporating a user-defined, parallel test access mechanism (TAM) to speed up the testing process. The user-defined TAM means the detail of TAM design is excluded from standard and decided by system integrator. Therefore, we propose a customized TAM structure and two approaches to guarantee full-spatial-parallelism under a bus width limit, and aim to minimize the total number of wire connections. In order to know how close to optimal solution our solutions are, we implement a Simulated Annealing (SA) algorithm to do the comparison. The experimental results of the two proposed approaches based on benchmark ISCAS’89 and ITC’02 show the parallelism can be guaranteed by our approaches while using only a few wire connections per pin, and the execution times of them are shorter compared with the SA algorithm.
| Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:liu-62671 |
| Date | January 2010 |
| Creators | Tseng, Kuei-Hsi |
| Publisher | Linköpings universitet, ESLAB - Laboratoriet för inbyggda system |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, info:eu-repo/semantics/masterThesis, text |
| Format | application/pdf |
| Rights | info:eu-repo/semantics/openAccess |
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