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Transport Imaging developing an optical technique to characterize bulk semiconductor materials for next generation radiation detectors /

Thesis (M.S. in Physics)--Naval Postgraduate School, June 2009. / Thesis Advisor(s): Haegel, Nancy M. "June 2009." Description based on title screen as viewed on July 10, 2009. Author(s) subject terms: Cathodoluminescence, Diffusion, Drift, Mobility, Lifetime, Bismuth Ferrite, BiFeO3 , Semiconductor, Transport Imaging. Includes bibliographical references (p. 61-62). Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/424606927
Date January 2009
CreatorsCatalano, Sarah L.
PublisherMonterey, Calif. : Naval Postgraduate School,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source(1,099 KB)

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