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Modelling and analysis of failures in CMOS integrated cirucuits

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.335927

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:335927
Date	January 1993
Creators	Johnson, Simon
Publisher	Durham University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation
Source	http://etheses.dur.ac.uk/1562/