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The intra-nodal capacitances of polycrystalline silicon thin film transistors : measurement and modelling

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362868

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:362868
Date	January 1994
Creators	Tam, Simon Wing-Bun
Publisher	University of Cambridge
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation