The increasing number of small and fragile parts that are being manufactured using micromachining technology has raised the demand for co-ordinate measurement machines (CMM) that can measure on a micro- and millimetric scale without contacting the part, thus avoiding damage to the surface of the part. These instruments are expected to measure on a micro- and millimetric scale with a measuring uncertainty in the nanometre range. A number of techniques used for contactless surface measurements exist, such as the focus variation (FV) technique, which have the ability to perform measurements on the micro- and millimetric scale in a short amount of time. These instruments may have the potential to be implemented in a non-contact micro-CMM platform.
Identifer | oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:719177 |
Date | January 2014 |
Creators | Hiersemenzel, Florine |
Publisher | Loughborough University |
Source Sets | Ethos UK |
Detected Language | English |
Type | Electronic Thesis or Dissertation |
Source | https://dspace.lboro.ac.uk/2134/14920 |
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