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Characterization of the microstructure, grain boundaries and texture of nanostructured electrodeposited CoNi by use of Electron Backscatter Diffraction (EBSD) /

Zugl.: Aachen, Techn. Hochsch., Diss., 2007.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316282828
Date January 2008
CreatorsBastos da Silva Fanta, Alice,
PublisherGöttingen : Cuvillier,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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