Return to search

Essays on the evaluation of European patents /

Conn., Yale Univ., Diss.--New Haven, 2003. / Kopie, ersch. im Verl. UMI, Ann Arbor, Mich. - Enth. 2 Beitr.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/254641821
Date January 2003
CreatorsDeng, Yi.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

Page generated in 0.0014 seconds