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Experimental investigation of fluctuations in sub-micron III-V field-effect transistors

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.274261

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:274261
Date	January 2003
Creators	Hamill, Stephen Gerard
Publisher	University of Glasgow
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation