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Hierarchical testing of integrated circuits

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:291399
Date January 1991
CreatorsMicallef, Steven P.
PublisherUniversity of Oxford
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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