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Integrated circuit reliability studies of electromigration, stressmigration and copper contamination

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.323656

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:323656
Date	January 1999
Creators	Low, Kia Seng
Publisher	University of Newcastle Upon Tyne
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation