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An investigation of 'design for testability' techniques in very large scale integrated circuits

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370643

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:370643
Date	January 1986
Creators	Sayers, I. L.
Publisher	University of Newcastle Upon Tyne
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation