This work focuses on the atomic force microscope: its hardware, modes of operation, and applications. / The construction of a x-y sample positioner, equipped with position dependent capacitive sensor, is presented. The implementation of a temperature-controlled laser for cantilever detection, via interferometry, is also discussed. / Two modes of atomic force microscopy are used. Amplitude modulation mode images are done in vacuum using Q-control to reduce the apparent Q-factor of the cantilever. Frequency modulation mode is used to obtain non-contact images and force curves above a quantum dot or gold sample. The former leads to detection of single electron charging events from a buried 2D electron gas to the surface layer of the sample. The latter was done to determine the geometric behaviour and capacitance of high-aspect ratio cantilever tips; a method for which is presented where the height, cone angle, radius of curvature and angle to the sample can be controlled.
| Identifer | oai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.100785 |
| Date | January 2006 |
| Creators | Cockins, Lynda Patricia. |
| Publisher | McGill University |
| Source Sets | Library and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada |
| Language | English |
| Detected Language | English |
| Type | Electronic Thesis or Dissertation |
| Format | application/pdf |
| Coverage | Master of Science (Department of Physics.) |
| Rights | © Lynda Patricia Cockins, 2006 |
| Relation | alephsysno: 002590574, proquestno: AAIMR32681, Theses scanned by UMI/ProQuest. |
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