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A Search for Defect Energy Levels Produced in Czochralski Grown Silicon Irradicated with 22 Mev Protons, using Infrared Absorption Techniques

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Identiferoai:union.ndltd.org:wm.edu/oai:scholarworks.wm.edu:etd-4868
Date01 January 1967
CreatorsHill, Gerald Franklin
PublisherW&M ScholarWorks
Source SetsWilliam and Mary
LanguageEnglish
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceDissertations, Theses, and Masters Projects
Rights© The Author

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