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Methods of optical measurements based on the reflection of a double-ellipsoid structure

In this study, a double-ellipsoid structure is proposed for measurements of optical properties of liquid-crystal displays (LCDs). By using the double-ellipsoid structure, light dispersion and measurement time, which occurs during the measurement of optical properties of LCDs, can be greatly reduced. The system also significantly decreases reflective loss on interface, increasing the accuracy of the measurement. Moreover, by using the conoscopy measured from the proposed structure, light distribution of the dark state along off-axis direction can be analyzed. Based on the analysis, the cell gap and pretilt angle of vertical alignment liquid-crystals (VA-LCs) are evaluated. The proposed structure, which exhibits a fast and high accuracy measurement, is highly promising for future optical measurement of LCDs.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0826111-170430
Date26 August 2011
CreatorsShieh, Chi-Shin
ContributorsChie-Tong Kuo, Chi-Huang Lin, Chi-Yen Huang
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageEnglish
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0826111-170430
Rightsuser_define, Copyright information available at source archive

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