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Carbon Contamination Measurements in Single Silicon Crystals

The intent of this investigation was to directly measure the amount of carbon contamination in a single silicon crystal and, in so doing, develop a mathematical procedure that would be applicable to other contaminants in other substances.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc131331
Date12 1900
CreatorsLogsdon, Lawrence E.
ContributorsGray, Thomas James, 1917-, Dawson, David Fleming
PublisherNorth Texas State University
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formatv, 37 leaves : ill., Text
RightsPublic, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Logsdon, Lawrence E., Jr.

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