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Statistical Critical Path Identification and Classification

This thesis targets the problem of critical path identification in sub-micron devices. Delays are described using Probability density functions (Pdfs) in order to model the probabilistic nature of the problem. Thus, a deterministic critical path response is not possible. The probability that each path is critical is reported instead. Extensive literature review has being done and presented in detail. Heuristics for accurate critical path calculations are described and results are compared to those from Monte Carlo simulations.

Identiferoai:union.ndltd.org:siu.edu/oai:opensiuc.lib.siu.edu:theses-1580
Date01 May 2011
CreatorsPanagiotakopoulos, Georgios
PublisherOpenSIUC
Source SetsSouthern Illinois University Carbondale
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceTheses

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