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Influence of carrier freeze-out on SiC Schottky junction admittance

Thesis (Ph. D.)--Mississippi State University. Department of Electrical and Computer Engineering. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/47884720
Date January 2001
CreatorsLos, Andrei.
PublisherMississippi State : Mississippi State University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic books. Electronic resources. Electronic theses/dissertations. Dissertations.
SourceClick Here For Electronic Version

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