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Microstructure and field angle dependence of critical current densities in REBa/sub 2/Cu/sub 3/O/sub y/ thin films prepared by PLD method

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Identiferoai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/6777
Date06 1900
CreatorsIchino, Y., Honda, R., Miura, M., Itoh, M., Yoshida, Y., Takai, Y., Matsumoto, K., Mukaida, M., Ichinose, A.
PublisherIEEE
Source SetsNagoya University
LanguageEnglish
Detected LanguageEnglish
TypeArticle(publisher)
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