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Constitutive modeling and experimental investigations of phase transitions in silicon under contact loading

Modeling the interaction of a silicon (Si) surface with a pointed asperity is a crucial step towards the understanding of several phenomena related to machining of this important semiconductor.

If subjected to pressure or contact loading, Si undergoes a series of stress-driven phase transitions accompanied by large volume changes.

We developed a finite deformation constitutive model that captures the semiconductor-to-metal (cd-Si ➙ β-Si) and metal-to-amorphous (β-Si ➙ a-Si) transitions within the framework of thermodynamics with internal variables.

The model was implemented as a user material subroutine for the finite element code Abaqus/Std. in analogy to pressure sensitive, rate independent, non-associated, non-smooth multisurface plasticity. Material parameters were identified from indentation load-displacement curves in (111)-Si using a Berkovich indenter tip.

The constitutive model was verified by successfully predicting the load-displacement curves for different indenters, the residual surface profile, as well as the size and shape of the transformation zone under the indenter tip as compared to TEM results.

Identiferoai:union.ndltd.org:DRESDEN/oai:qucosa:de:qucosa:70886
Date13 July 2020
CreatorsBudnitzki, Michael
ContributorsKuna, Meinhard, Bertram, Albrecht, TU Bergakademie Freiberg
PublisherTU Bergakademie Freiberg
Source SetsHochschulschriftenserver (HSSS) der SLUB Dresden
LanguageEnglish
Detected LanguageEnglish
Typeinfo:eu-repo/semantics/updatedVersion, doc-type:doctoralThesis, info:eu-repo/semantics/doctoralThesis, doc-type:Text
Rightsinfo:eu-repo/semantics/openAccess
Relation2418092-0

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