This master thesis analyses the existing methods both practically and theoretically used to detect defected surface area in solar cells. Various methods were used but by using an upgraded CMOS camera without IR filter to implement the electroluminescence method, this has proven to have a very crucial impact on the results. Given the overall results and the acquired information, a procedure with a simple parameter can be setup to carry out the measurements. In addition to this a catalog was formed showing the defects occurring in mono and polycrystalline solar cells.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:318492 |
| Date | January 2017 |
| Creators | Lepík, Pavel |
| Contributors | Křivík, Petr, Vaněk, Jiří |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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