This thesis is concerned with image picture analysis, especially with images obtained by diagnostic LBIC method. The individual defects occuring on solar cells are described in theoretical part, including methods which serve for making referential image. Furthermore, the creation of difference image is analysed, from whom the interferences will be evaluated. The aim of practical part is to focus on generation of algorithms which investigate the defects, and the description of application for program control is described in conclusion.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:218414 |
| Date | January 2010 |
| Creators | Štencel, Jakub |
| Contributors | Křivík, Petr, Vaněk, Jiří |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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