This thesis presents the results of a 28 GHz continuous-wave (CW) diffraction measurement campaign in the Washington, DC area. It describes the measurement approach including information on equipment and testing methods. Also described are the various parameters that affected the diffraction loss. Observed diffraction losses showed little dependence on polarization and building material. For diffraction angles greater than 5 degrees, a simple linear equation was fit to the data and accurately describes the diffraction loss. A logarithmic equation describes the dependence at smaller angles. The model developed shows very good agreement with theory and other measurements.
Also included are an overview of the fixed wireless industry, a discussion of system design issues, and a review of the historical and mathematical development of diffraction theory. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/36891 |
| Date | 24 August 1998 |
| Creators | Tenerelli, Peter A. Jr. |
| Contributors | Electrical Engineering, Bostian, Charles W., Jacobs, Ira, Stutzman, Warren L., Stivers, Camilla, Harmon, Michael M., Yoon, Roe-Hoan |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Detected Language | English |
| Type | Thesis |
| Format | application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | TENETD.PDF |
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