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Digital circuit wear-out due to electromigration in semiconductor metal lines a thesis /

Thesis (M.S.)--California Polytechnic State University, 2009. / Title from PDF title page; viewed on January 5, 2010. Major professor: John Oliver, Ph.D. "Presented to the faculty of California Polytechnic State University, San Luis Obispo." "In partial fulfillment of the requirements for the Master of Science Degree in Electrical Engineering." "November 2009." Includes bibliographical references (p. 90-92).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/497966525
Date January 1900
CreatorsWilkinson, Gregory Ross. Oliver, John Y.
Publisher[San Luis Obispo, Calif. : California Polytechnic State University],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick here to view

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