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High-level test generation and built-in self-test techniques for digital systems /

Lic.-avh. Linköping : Univ., 2002.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/186243998
Date January 2002
CreatorsJervan, Gert,
PublisherLinköping : Univ.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceFulltext m. m. från Linköping University Electronic Press

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