Return to search

Optical properties of GaMnN films grown by PA-MBE

We have grown Ga1-xMnxN films on c-sapphire substrate by plasma-assisted MBE with different Mn fluxes. The films are characterized by scanning electron microscopy (SEM), energy dispersive spectrometer (EDS), electron backscatter diffraction (EBSD), high¡Vresolution X-ray diffraction (HR-XRD), Raman scattering, photoluminescence (PL), cathodoluminescence (CL), transmission spectra, reflection spectra and X-ray photoelectron spectroscopy (XPS).
The SEM images show films thickness between 550 to 850 nm and EBSD indicates samples normal direction is c-axis. EDS spectra show the Mn is present in GaMnN samples. According to XRD and Raman scattering, Mn element occupying Ga site on GaN and Mn-N clusters phase coexist on films. From transmission and reflection spectra, stronger absorption at about 1.5 eV and 1.8 eV to 3.4 eV absorption band are found. The PL and CL show GaN band gap at 3.4 eV and blue band from 2.4 eV to 3.3 eV maybe due to defect level. Finally, the XPS spectra indicate Mn acceptor level is contributed to Mn+2 or Mn+3 states.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0809111-152543
Date09 August 2011
CreatorsChiang, Wei-Yang
ContributorsDer-Jun Jang, Quark Chen, Shih-Wei Feng, Li-Wei Tu, Wang-Chuang Kuo
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0809111-152543
Rightsuser_define, Copyright information available at source archive

Page generated in 0.0021 seconds