Thesis (Ph. D.)--Southern Illinois University Carbondale, 2008. / "Department of Electrical and Computer Engineering." Keywords: Test pattern generation, Test application time Includes bibliographical references (p. 87-95). Also available online.
| Identifer | oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/505933314 |
| Date | January 2008 |
| Creators | Abdulrahman, Arkan M., |
| Source Sets | OCLC |
| Language | English |
| Detected Language | English |
| Source | Available to subscribers only. |
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