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A reliability study of the RFID technology

Thesis (M.S. in Electrical Engineering)--Naval Postgraduate School, December 2006. / Thesis Advisor(s): Ha, Tri T. ; Su, Weilian. "December 2006." Description based on title screen as viewed on March 12, 2008. Includes bibliographical references (p. 55-56). Also available in print.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/213355027
Date January 2006
CreatorsNg, Ling Siew.
PublisherMonterey, Calif. : Naval Postgraduate School,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source(1.01MB)

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