A simulation study of the error induced in one-shine reliability confidence bounds for the Weiball distribution using a small sample size with heavily censored data /

Description

Thesis (M.S. in Applied Science)--Naval Postgraduate School, Dec. 2004. / Thesis Advisor(s): David H. Olwell. Includes bibliographical references (p. 57). Also available online.

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1. http://library.nps.navy.mil/uhtbin/hyperion/04Dec%5FHartley.pdf

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/58524954
Date	January 2004
Creators	Hartley, Michael A.
Publisher	Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service,
Source Sets	OCLC
Language	English
Detected Language	English
Source	(1.06 MB)