Impact of the interface capacity on failure mechanisms and size effects in ferroelectric thin films /

Description

Techn. Hochsch., Diss., 2005--Aachen.

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1. http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=014901290&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/179950200
Date	January 2006
Creators	Ellerkmann, Ulrich.
Publisher	Aachen : Shaker,
Source Sets	OCLC
Language	English
Detected Language	English