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Premelting at the ice-SiO2 interface a high-energy x-ray microbeam diffraction study /

Zugl.: Stuttgart, Univ., Diss., 2005.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/637553499
Date January 1900
CreatorsEngemann, Simon Christoph.
PublisherNorderstedt : Books on Demand GmbH,
Source SetsOCLC
LanguageUndetermined
Detected LanguageEnglish

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