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Estudo de orientacoes cristalograficas de acos ao silicio utilizando tecnicas de difracao de raios X, difracao de eletrons e metodo ETCH PIT

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06781.pdf: 5180316 bytes, checksum: 400f92bad2534a326e86a6f14c3ba5cb (MD5) / Dissertacao (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN/CNEN-SP

Identiferoai:union.ndltd.org:IBICT/oai:10.40.40.102:123456789/10783
Date09 October 2014
CreatorsSANTOS, HAMILTA de O.
ContributorsOrientador: Waldemar Alfredo Monteiro
Source SetsIBICT Brazilian ETDs
Detected LanguagePortuguese
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format82
Sourcereponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
CoverageN
Rightsinfo:eu-repo/semantics/openAccess

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