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Non-Contact Probes: A Novel Approach for On-Wafer Characterization of Millimeter-Wave and Sub-Millimeter-Wave Devices and Integrated Circuits

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1461163685
Date27 September 2016
CreatorsCaglayan, Cosan
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1461163685
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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