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Structure determination by low energy electron diffraction of GaN films on 6H-SiC(0001) substrate by molecular beam epitaxy

Thesis (Ph. D.)--University of Hong Kong, 2006. / Title proper from title frame. Also available in printed format.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/85497424
Date January 2005
CreatorsMa, King-man, Simon.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

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