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Computer controlled capacitance transients determination of defect centres in epitaxial silicon

No description available.

1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.332145

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:332145
Date	January 1984
Creators	Marshall, A.
Publisher	Nottingham Trent University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation