The present work provides charge state fractions that may be used to generate TEAMS relative sensitivity factors for impurities in semiconductor materials.
Identifer | oai:union.ndltd.org:unt.edu/info:ark/67531/metadc278340 |
Date | 12 1900 |
Creators | Renfrow, Steven N. (Steven Neal) |
Contributors | McDaniel, Floyd Del. (Floyd Delbert), 1942-, Duggan, Jerome L., Weathers, Duncan L. |
Publisher | University of North Texas |
Source Sets | University of North Texas |
Language | English |
Detected Language | English |
Type | Thesis or Dissertation |
Format | v, 84 leaves : ill., Text |
Rights | Public, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Renfrow, Steven N. (Steven Neal) |
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