This thesis describes XL, an x-ray imaging simulator for luggage inspection. This software system runs on a workstation and models x-ray sources, x-ray detectors and objects between them. A simple graphical interface permits the user to specify simulation parameters and inputs. XL then uses Monte Carlo methods to simulate x-ray interaction with matter, including the photoelectric effect, coherent scattering, and incoherent scattering. Finally, XL can produce x-ray images which agree closely with experimental data obtained from a commercial luggage scanner. The simulator will be a valuable tool in the development of future x-ray scanners, particularly those designed to detect explosives in luggage. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/46417 |
| Date | 23 December 2009 |
| Creators | Xie, Wei |
| Contributors | Electrical Engineering, Abbott, A. Lynn, Conners, Richard W., Kline, D. Earl |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Language | English |
| Detected Language | English |
| Type | Thesis, Text |
| Format | x, 105 leaves, BTD, application/pdf, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | OCLC# 34309019, LD5655.V855_1995.X55.pdf |
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