Good failure analysis is the ability to determine the site of a circuit defect quickly and accurately. We propose a method for defect site prediction that is based on a site's probability of excitation, making no assumptions about the type of defect being analyzed. We do this by analyzing fault signatures and comparing them to the defect signature. We use this information to construct an ordered list of sites that are likely to be the site of the defect.
| Identifer | oai:union.ndltd.org:tamu.edu/oai:repository.tamu.edu:1969.1/95 |
| Date | 30 September 2004 |
| Creators | Trinka, Michael Robert |
| Contributors | Mercer, M. Ray |
| Publisher | Texas A&M University |
| Source Sets | Texas A and M University |
| Language | en_US |
| Detected Language | English |
| Type | Book, Thesis, Electronic Thesis, text |
| Format | 213991 bytes, 32875 bytes, electronic, application/pdf, text/plain, born digital |
Page generated in 0.0019 seconds