No fault found (NFF) errors, i.e. errors which origin has not been established, irregularly occur in electronic devices. The actual cause of such errors varies but one, possibly more prominent, source for these soft errors is atmospheric radiation. The overarching aim of this thesis is to demonstrate: 1) the importance of keeping the atmospheric radiation environment in mind when designing robust airborne systems, 2) how to take this environment into consideration when applying mitigation techniques which may drastically reduce the risk of SEEs (Single Event Effects) which can cause NFF errors. To achieve these goals, Part 1 of this thesis describes how cosmic rays affect electronics (i.e. what kind of errors may be induced), which types of devices are susceptible to radiation, and why this subject is of extra importance for airborne systems. In addition, soft error mitigation techniques, which may be applied at different design levels to reduce the soft error rate (SER) or the impact of soft errors, are also presented. The aim is further corroborated by Part 2. Five subsystems of a modern aircraft are studied and real examples of failures potentially induced by atmospheric radiation are presented. For each of the five systems, all errors that have been reported for these (in the past few years) have been studied, and the number of errors found to be potentially induced by cosmic radiation has been listed and compared to number of expected soft errors based on calculations and previous experimental tests.
Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:liu-96726 |
Date | January 2013 |
Creators | Bolinder, Richard |
Publisher | Linköpings universitet, Programvara och system, Linköpings universitet, Tekniska högskolan |
Source Sets | DiVA Archive at Upsalla University |
Language | English |
Detected Language | English |
Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
Format | application/pdf |
Rights | info:eu-repo/semantics/openAccess |
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