This thesis describes the study and characterization of secondary created structures in PN junction of silicon solar cells. Secondary created structure is the term which means the structures created for the purpose of suppressing the negative influence of local defects and edges of the solar cell. This means in particular laser notches used to isolate the edges. Furthermore, the secondary created structure means modification defective area using focused ion beam milling. Theoretical part of this work deals with short introduction to the topic of solar cells. There are mentioned the physical nature of the solar cell and the technology associated with the issue of solar cells. Experimental section begins with a description of the experimental methods. For diagnostic methods were used both electrical (UI characteristics, noise characteristics) and optical methods (measuring local radiation - CCD camera, thermal imager, lock-in thermography). Furthermore, there was also used a scanning electron microscope (SEM) equipped with technology using Focused Ion Beam (FIB). Sequentially there are presented individual results of characterization of created structures by laser. These partial results are incorporated into a comprehensive methodology developed for characterizing laser-created structures. The experimental part is finished by a presentation of the results of the research use of focused ion beam technology for sputtering defective areas of solar cells.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:234346 |
| Date | January 2015 |
| Creators | icner, Ji |
| Contributors | Číp, Ondřej, Navrátil, Vladislav, Koktavý, Pavel |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.0018 seconds