Thesis (Ph. D.)--University of Queensland, 2002. / Includes bibliographical references.
| Identifer | oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/52249886 |
| Date | January 2001 |
| Creators | Lau, Mei Po Mabel. |
| Publisher | St. Lucia, Qld., |
| Source Sets | OCLC |
| Language | English |
| Detected Language | English |
| Source | Characterization of hot-carrier induced degradation via small-signal characteristics in mosfets</a><br>Read the abstract of the thesis. |
Page generated in 0.0031 seconds